Reliability Topics for the Miniaturization and Qualification of Advanced Silicon CMOS Technologies
June 25 @ 10:00 am - 11:00 am
Join us for an IEEE EDS DL seminar given by Dr. Fernando Guarin. The talk explores the shift from digital-centric qualification to the specialized reliability methodologies required for advanced RF and 5G applications. It highlights how miniaturization, SOI, and hot carrier effects drive the characterization frameworks necessary for successful high-volume manufacturing.
Time: Jun 25, 2026 10:00 AM Eastern Time (US and Canada)
Join Zoom Meeting
https://utoronto.zoom.us/j/83546396416
Meeting ID: 835 4639 6416
Passcode: 869614
